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KMID : 0385519930060020217
Analytical Science & Technology
1993 Volume.6 No. 2 p.217 ~ p.223
AES Analysis of Au,Au/Cr, Au/Ni/Cr and Au/Pd/Cr Thin Films by the Change of Substrate Temperature and Annealing Temperature
À¯±¤¼ö/Yoo, Kwang Soo
Á¤ÇüÁø/Jung, Hyung Jin
Abstract
AES analysis, Au thin film, Inter-diffusion.
KEYWORD
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